Original Article

Comparison of ocular biometry in Chinese patients using two swept-source optical coherence tomography devices

:22-77
 
Background: To compare two swept-source optical coherence tomography (SS-OCT) biometers,IOLMaster 700 and ANTERION.
Methods: This is a retrospective study. Biometric measurements of cataract patients performed between March and July 2021 in the Department of Ophthalmology, United Christian Hospital, Hong Kong, were reviewed. Patients scheduled for cataract surgery were measured with both SS-OCT devices on the same day.The following biometry parameters were compared: keratometry (K), total keratometry (TK), axial length (AL), central corneal thickness (CCT), anterior chamber depth (ACD), lens thickness (LT), white-to-white (WTW) and the predicted intraocular lens (IOL) power to achieve emmetropia. To assess the agreement between the devices, Bland-Altman analysis with 95% limits of agreement (LoA) were used.
Results: In total, 92 eyes of 47 subjects were measured with both devices. There were statistically significant differences between the two biometers for most measurements (P<0.05) except for flat K, AL and IOL power when using the right eyes for analysis. For the left eyes, there were statistically significant differences in the measurements from the two biometers in all parameters except for flat and steep K. The ANTERION did not obtain ACD, AL and LT in 2 (2.17%), 1 (1.09%) and 5 cases (5.43%) respectively.
Conclusions: The two biometers showed a clinically acceptable agreement in most parameters. Comparisons showed significant differences in most parameters but not clinically relevant except for the TK and WTW, and these two parameters should not be used interchangeably between the devices.
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    Executive director:Ministry of Education of the People's Republic of China
    Host: Sun Yat-sen University
    Undertake: Zhongshan Ophthalmic Center, Sun Yat-sen University
    Editors-in-Chief: 林浩添
    Executive director:Ministry of Education of the People's Republic of China
    Host: Sun Yat-sen University
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